Improved Model on Buried-Oxide Damage Induced by Total-Ionizing-Dose Effect for HV SOI LDMOS

Protective effect of ferulic acid on ionizing radiation induced damage in bovine serum albumin

Background: Ionizing radiation causes deleterious effects on living system mainly due to oxidative damages of macromolecules and protein is the major target due to its abundance. The aim of this study was to investigate the effects of ionizing radiation induced changes in the molecular properties of bovine serum albumin (BSA) its secondary and tertiary structures, degradation, cross linking and...

Modeling of Total Ionizing Dose Effects in Advanced Complementary Metal-Oxide-Semiconductor Technologies by

i ABSTRACT The increased use of commercial complementary metal-oxide-semiconductor (CMOS) technologies in harsh radiation environments has resulted in a new approach to radiation effects mitigation. This approach utilizes simulation to support the design of integrated circuits (ICs) to meet targeted tolerance specifications. Modeling the deleterious impact of ionizing radiation on ICs fabricate...

TOTAL IONIZING DOSE EFFECTS IN ADVANCED CMOS TECHNOLOGIES By

Professor Sokrates T. Pantelides ii ACKNOWLEDGMENTS I would first of all like to thank my husband Pierre who has been supportive and patient with me on my journey of attaining a Ph.D. He believed in me even when I did not believe in myself, he listened countless times to my presentations and helped me perfect them. I would also like to thank my parents and my sister Myriam for everything they h...

A DC Model for Partially Depleted SOI Laterally Diffused MOSFETs Utilizing the HiSIM-HV Compact Model

This paper presents a subcircuit compact model to study the dc characteristics of a partially depleted (PD) SOI laterally diffused metal oxide semiconductor field effect transistor (LDMOSFET) utilizing the HiSIM-HV compact model. Our model accounts both for the high-voltage and the floating-body effects such as the quasi saturation effect, the impact ionization in the drift region and the famou...

Total Ionizing Dose Radiation Effects on Germanium Pmos Devices